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Atomic Force Microscopy
Atomic Force Microscopy (AFM)
The atomic force microscope is
currently the only instrument able to image biological samples (see
below - DNA tethered to a surface) with molecular resolution in buffer
solution. Not only can the AFM provide topographical images of
surfaces, but forces between single molecules and the mechanical
properties of biological samples can also be investigated. Since
measurements are made while biological samples are in buffer solutions
the samples remain alive, and temporal changes in structure can be
measured.
In AFM imaging a fine tip attached to
a cantilever spring is scanned over the sample surface. The interaction
between the cantilever tip and the sample causes the cantilever to
bend, which is detected by the deflection of a laser beam focused on
the end of the cantilever. From this bending, a force between the
sample and the tip can be calculated. A piezoelectric surface (piezo)
is used to measure the x and y direction and to adjust the vertical
distance between the tip and sample. Two different AFM modes determine
how the vertical distance is determined: 1) Contact Mode: The feedback
loop between the laser detector and piezo adjusts the vertical distance
from the tip to the sample such that the cantilever is held at a
constant deflection. 2) Dynamic Mode: The feedback loop keeps the
amplitude of a vibrating cantilever constant by correcting the vertical
distance. Other applications of the Atomic Force Microscope include:
formation of force-distance curves, measurements of adhesion or
elasticity and measurements of the biding and rupture forces of
receptor-ligand complexes. Discussions of the applications of AFM can
be found in the refernce PDFs at the bottom of the page. To learn
more read
Theory Practic and Applications text (large file > ) and try
the virtual
AFM lab experience.
Those wishing to purchase an AFM may want to read through the Park
Systems evaluation guide . A
quick
comparison table of microscopy techniques is also available .

Applications:
- Visualization
- Physical property maps
- Spacial Metrology: Nanoscience and nanotechnology
- Electrochemistry
Pros:
- Can image conducting or non-conducting surface
- Little to no sample preparation in many cases
Cons:
- Tip-sample interactions can distort or destroy the sample
- AFM cannot image all biological samples at atomic resolution
- Repetative scanning can detach sample
- Specimen must be firmly attached to a solid support for
measurement
- Information gained is generally restricted to regions of the
specimen that are directly exposed to the scanning tip.
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